The Fresnel Coefficient of Thin Film Multilayer Using Transfer Matrix Method TMM

2nd International Conference on Sustainable Engineering Techniques

工业技术（总论）

Mohammed, Zahraa Hummam^1

Electrical Engineering Department, Al-Mustansiriayah University, Baghdad, Iraq^1

关键词: angle of incident;    Bearing surfaces;    Charged surfaces;    Fresnel coefficient;    Thin film multilayers;    Transport matrix method;    Transverse waves;    Wavelength regimes;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/518/3/032026/pdf
DOI  :  10.1088/1757-899X/518/3/032026

学科分类：工业工程学

来源: IOP

【 摘 要 】

When the light incident on a multilayer planar mound, it is reflected, transmitted, and absorbed in the method that derived the Fresnel equations. The metal used in this work is the thin film of gold put on the glass. The properties of the preparation of waveform for dielectric charged surface Plasmon polariton structure of the bearing surface of the carrier plasma were studied using a simple transport matrix method(TMM), The Transfer Matrix Method (TMM) used to calculate the reflection, transmission & absorption for both TE (transverse wave) and TM (magnetic browser for the oblique incident plane wave. The relation between the incident angle with the Fresnel coefficient plotted at the different wavelength regimes (300nm,700nm,1200nm) was plotted using the program of the TMM written in Matlab (R2013). The best result for this Fresnel coefficient in the visible incident plane wave with wavelength = 700nm.