Contact Phenomena in Micromachining: Modelling and Simulation

1st International Conference on Industrial and Manufacturing Engineering

工业技术（总论）;机械制造

Siregar, Ikhsan^1 ; Saedon, J.B.^2 ; Adenan, Mohd Shahriman^2 ; Nor, Norhafiez Mohd^2 ; Pazai, N.M.Izzat M.^2

Fakultas Teknik, Universitas Sumatera Utara, Kampus USU, Medan, Indonesia^1

Fakulty of Mech. Eng, UiTM MARA, Shah Alam, Selangor, Malaysia^2

关键词: AISI D2;    Arbitrary Lagrangian Eulerian;    Chip width;    Contact phenomena;    Development process;    Modelling and simulations;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/505/1/012093/pdf
DOI  :  10.1088/1757-899X/505/1/012093

学科分类：工业工程学

来源: IOP

【 摘 要 】

The chip development process is an active procedure that is frequently nonlinear. A chip resolve not arrangement once the cutting penetration is a smaller amount than the smallest chip width available. This research shows a series of simulation results that work with finite element methods in a sophisticated radius conclusion on micromachining. A prototypical is industrialised by considering a method, this method is arbitrary Lagrangian-Eulerian (ALE). Popular this study analyzed and simulated chip development, chip progress and the mechanism of material distortion that occurs throughout micromachining AISI D2.