会议论文详细信息
2nd International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies"
Research of influence of technological admissions on characteristics of a solid-state wave gyroscope
Pevtsov, E.Ph.^1 ; Demenkova, T.A.^1 ; Grishunin, K.A.^1
Moscow Technological University MIREA, Moscow State Institute of Radio-engineering Electronics and Automation, Prospekt Vernadskogo 78, Moscow
119454, Russia^1
关键词: Design data;    Mass defect;    Nodal points;    Resonance frequencies;    Ring resonator;    Technological operations;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/498/1/012010/pdf
DOI  :  10.1088/1757-899X/498/1/012010
来源: IOP
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【 摘 要 】

The route of design and technique of simulation of a wave solid-state gyroscope with the ring resonator are developed. Simulation of dependences of gyroscope characteristics on design data and their optimization for the job of the necessary mode of movement, in particular, of resonance frequency of excitation of the second mode are executed. The technique of compensation of the mass defects resulting from admissions on technological operations of production of a wave solid-state gyroscope (technological defects) and leading to the shift of initial provision of nodal points is presented.

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