Comparative analysis of silicon nanostructures by x-ray diffraction technique

7th International Conferences on Physics and Technology of Nanoheterostructure Microwave Electronics: Mokerov Readings 2016;8th International Conferences on Physics and Technology of Nanoheterostructure Microwave Electronics: Mokerov Readings 2017

Kharin, A Yu^1 ; Assilbayeva, R.B.^2 ; Kargina, Yu V.^1^3 ; Timoshenko, V. Yu^1^3

National Research Nuclear University MEPhI, Bio-Nanophotonic Lab., Moscow

115409, Russia^1

Satpaev National Research Kazakh University, Almaty

050013, Kazakhstan^2

Lomonosov Moscow State University, Physics Department, Moscow

119991, Russia^3

关键词: Aqueous suspensions;    Comparative analysis;    Crystalline Si;    Dissolution process;    Microporous silicon;    Silicon nano structures;    Silicon nanoparticles;    X-ray diffraction techniques;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/475/1/012010/pdf
DOI  :  10.1088/1757-899X/475/1/012010

来源: IOP

【 摘 要 】

Silicon nanoparticles and nanowires prepared by using different methods were investigated by means of x-ray diffraction (XRD) technique. Broadening of the XRD lines of crystalline Si lattice allows us to estimate the mean size of nanoparticles. Silicon nanoparticles stored in aqueous suspensions for several days were found to decrease their sizes due to dissolution process. The kinetics of dissolution for different kinds of nanoparticles were found to be different. It was also shown that the most unstable nanoparticles (microporous silicon ones) could be protected from dissolution via interaction with the polysaccharide molecules (dextrane) into the solution.