Methods and Metrics for Reliability Assessment

Fault-Tolerant Distributed Algorithms on VLSI Chips

计算机科学;物理学

Lirida Alves de Barros Naviner, Jean-Franc¸ois Naviner, Denis Teixeira Franco,

PID  :  79802

学科分类：计算机科学（综合）

来源: CEUR

【 摘 要 】

This paper deals with digital VLSI design aspects relatedto reliability. The focus is on the problem of reliability evaluation in combinational logic circuits. We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.